- Manual wafer probers are designed for probing
wafers with fixed position probe cards.
- These probers are primarily used for wafer mapping and wafer sampling on a
production line.
- High quality manual wafer probers are suitable for engineering applications
where a sampling test
must be performed on 6", 8", or 12 inch wafers.
Cascade Microtech Summit 11000, 12000 series wanted
Alessi REL48 & 6100 series probe stations wanted
- Probes available are; tungsten probe, micromanipulator, and ultrasonic
transducer.
- Hot Cold stage -65c to +150c, is capable of precise, and thorough
environmental test of wafers.
Socket stage adapters for 14 lead dip, 300 mil, soic, tsop, BGA, device
types.
- Motorized stage drive allows for for push button control of the X & Y axis
vacuum stage movement.
- High frequency / Low Level Probes are coaxial with brass mounting shank and
body. The coaxial
probe points and are generally made of pure tungsten. The
dielectric is Teflon with an outside
sheath of copper.
- Probe points have a nominal radius of .40 microns.
- Some manipulators are designed to position electrical test probes on miniature
circuitry, providing
quick movement from one test area to another, with excellent positioning
resolution accuracy.
www.wafer-probing.com wafer probe,
wafer probing, wafer test, wafer inspection, wafer testing.
used
semiconductor production equipment and used wafer probers.
Used wafer probers and inspection equipment, used 8" probers, manual, semi auto,
automatic wafer probe, wafer inspection systems, wafer defect analysis system
for sale.
Access Surplus Pre-owned test
& measurement, electronics, integrated circuits & components,
that you can buy or sell.
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